Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.11861/7576
Title: | Learning non-overlapping rules a method based on functional dependency network and MDL genetic programming |
Authors: | Shum, Wing-Ho Prof. LEUNG Kwong Sak Wong, Man-Leung |
Issue Date: | 2006 |
Source: | 2006 IEEE Congress on Evolutionary Computation, CEC 2006, pp. 702 - 709, Article number 1688380 |
Journal: | 2006 IEEE Congress on Evolutionary Computation, CEC 2006 |
Abstract: | Classification rule is a useful model in data mining. Given variable values, rules classify data items into different classes. Different rule learning algorithms are proposed, like Genetic Algorithm (GA) and Genetic Programming (GP). Rules can also be extracted from Bayesian Network (BN) and decision trees. However, all of them have disadvantages and may fail to get the best results. Both of GA and GP cannot handle cooperation among rules and thus, the learnt rules are likely to have many overlappings, i.e. more than one rules classify the same data items and different rules have different predictions. The conflicts among the rules reduce their understandability and increase their usage difficulty for expert systems. In contrast, rules extracted from BN and decision trees have no overlapping in nature. But BN can handle discrete values only and cannot represent higher-order relationships among variables. Moreover, the search space for decision tree learning is huge and thus, it is difficult to reach the global optimum. In this paper, we propose to use Functional Dependency Network (FDN) and MDL Genetic Programming (MDLGP) to learn a set of non-overlapping classification rules [17]. The FDN is an extension of BN; it can handle all kind of values; it can represent higher-order relationships among variables; and its learning search space is smaller than decision trees'. The experimental results demonstrate that the proposed method can successfully discover the target rules, which have no overlapping and have the highest classification accuracies. © 2006 IEEE. |
Type: | Conference Paper |
URI: | http://hdl.handle.net/20.500.11861/7576 |
ISBN: | 0780394879 978-078039487-2 |
Appears in Collections: | Applied Data Science - Publication |
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