Please use this identifier to cite or link to this item: http://hdl.handle.net/20.500.11861/7653
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dc.contributor.authorXu, Kebinen_US
dc.contributor.authorWang, Zhenyuanen_US
dc.contributor.authorHeng, Pheng-Annen_US
dc.contributor.authorProf. LEUNG Kwong Saken_US
dc.date.accessioned2023-03-29T05:31:22Z-
dc.date.available2023-03-29T05:31:22Z-
dc.date.issued2001-
dc.identifier.citationAnnual Conference of the North American Fuzzy Information Processing Society - NAFIPS, 2001, vol. 1, pp. 506 - 511en_US
dc.identifier.urihttp://hdl.handle.net/20.500.11861/7653-
dc.description.abstractA generalized Choquet integral with respect to a nonadditive sign measure is proposed, and serves as an aggregation tool to project the points of feature space onto a real axis to reduce an n-dimensional classification problem into a one-dimensional classification problem. The learning procedure of this new classification algorithm, GCIPP (Generalized Choquet Integral based Projection Pursuit), is just pursuing an appropriate projection direction optimally according to a criterion of minimizing the global misclassification rate. Such a nonlinear projection is characterized by the nonadditive sign measure and two weight vectors. The nonadditive sign measure is a proper representation of the contribution rate of each combination of the feature attributes, including each singleton, toward the classification, and its nonadditivity reflects the interactions among the feature attributes. Optimizing the sign measures and the weights is realized by an adaptive genetic algorithm. This new classifier is successfully tested on some simulated training data generated from the preset sign measures and weights, and it also performs well on several real-world data sets.en_US
dc.language.isoenen_US
dc.relation.ispartofAnnual Conference of the North American Fuzzy Information Processing Society - NAFIPSen_US
dc.titleUsing generalized choquet integral in projection pursuit based classificationen_US
dc.typeConference Proceedingsen_US
item.fulltextNo Fulltext-
crisitem.author.deptDepartment of Applied Data Science-
Appears in Collections:Applied Data Science - Publication
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